Scanning Electron Microscopy (SEM)

SEM Image Optimisation

At a neutral point of charge IB=ISE+IBSE, however in a general case surface charging will add an additional term. This build up of negative charge via absorbed e⁻ or positive charge via ionisation of surface species leads to deviation of scattered electrons by electrostatic forces, deforming the image. This is perceived as a shifting of the image over time as charge builds up.

Each of these currents is a function of the accelerating voltage, as shown schematically below. There exist two equilibrium (one stable and one unstable) points of nul charging: Eunstable at lower kV, and Estable at higher kV.

White_box_charging_theory.png
The sign of the surface charge influences electron deviation, but also the amount of scattered electrons reaching the detector. Thus, the following protocol is has been proposed by Dr. Ron Rasch:

AIBN_SEM_Optimisation_white_box.png

For polymer species, this E2 equilibrium point is situated around 1.5 kV of accelerating voltage, or 1.5 keV of electron energy. For Daramic coated with polyethylene glycol (PEG) the experimental optimum kV I found was 1.9 kV.


SEM protocol for pristine and PEG-coated Daramic membranes

Sample preparation

Surface samples

Cross-sections

Conductive coating

Pt (for morphology imaging) thickness: 15 nm

JEOL JSM-IT810 parameters

Parameter Setting
Accelerating voltage 1.9 kV (optimised kV-charging point)
Working distance 7.8 mm
Detector SE (scattered electrons)
Vacuum 9.6x10⁻⁵ Pa
Probe current 7 (on a scale from 1 to 14)
Scan Use quick for focussing, stigmatisation and the wobbler at 7000x mag, the use fine. Adjust with averaging at a higher scan speed over 20 samples if surface charging is an issue.

Surface orders of magnitude

Compare density of surface layers between membranes.